Electronic Device Reliability Assessment Service
We provide performance guarantees for devices under a wide range of temperatures!
We would like to introduce our "Electronic Device Reliability Evaluation Service." We provide performance guarantees for devices in response to changes in environmental factors for key devices that support 5G, high-speed and large-capacity communication, and high-performance computers, across a wide temperature range. We accommodate various tests, including semiconductor processes, evaluation tests, and evaluations of peripheral electronic components and materials. Please feel free to contact us when needed. 【Semiconductor Processes and Evaluation Tests, and Evaluation Tests for Peripheral Electronic Components and Materials (Partial)】 ■ TDDB Evaluation Test Wafer Evaluation (AMM-TDDB-W) ■ TDDB Evaluation Test/Semiconductor Parametric Test (AMM-TDDB-C/AMM/AMI) ■ Burn-in (Memory/Logic/Automotive Devices/Sensors) (RBC/RBS/RBM/MBI) ■ Electromigration Evaluation (Cu/Al/C4 Bump) (AEM) ■ Reverse Bias Test (Power Devices) (HTRB/HTGB/H3TRB/AMI) ■ Power Cycle Test (Power Devices) (RBS-PST) *For more details, please download the PDF or feel free to contact us.
- Company：エスペック
- Price：Other
